TY - JOUR
T1 - Study of particle fluence effects on collected charge and depletion voltage of the ATLAS IBL planar pixel sensors
AU - Aad, G.
AU - Aakvaag, E.
AU - Abbott, B.
AU - Abdelhameed, S.
AU - Kabana, S.
AU - ATLAS Collaboration
N1 - Publisher Copyright:
© 2026 CERN for the benefit of the ATLAS collaboration. Published by IOP Publishing Ltd on behalf of Sissa Medialab. Original content from this work may be used under the terms of the Creative Commons Attribution 4.0 licence. Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI.
PY - 2026/7
Y1 - 2026/7
N2 - After ten years of operation at the LHC, the planar pixel sensors of the innermost barrel layer of the ATLAS Pixel detector have accumulated an average bulk damage fluence in excess of 2×1015 1 MeV-neutrons equivalent/cm2. The macroscopic effects of this radiation are an increase of the sensor leakage current, a loss of charge collection efficiency and an increase of the depletion voltage. Using regular bias voltage scans performed at the beginning and end of each data taking campaign the evolution of the pixel cluster charge and bulk depletion is studied as a function of particle fluence. Results are interpreted with the modelling provided by standalone TCAD and ATLAS Monte Carlo simulation including radiation damage effects. The dependence of the collected charge and the depletion voltage with integrated luminosity are studied through the full period of operation.
AB - After ten years of operation at the LHC, the planar pixel sensors of the innermost barrel layer of the ATLAS Pixel detector have accumulated an average bulk damage fluence in excess of 2×1015 1 MeV-neutrons equivalent/cm2. The macroscopic effects of this radiation are an increase of the sensor leakage current, a loss of charge collection efficiency and an increase of the depletion voltage. Using regular bias voltage scans performed at the beginning and end of each data taking campaign the evolution of the pixel cluster charge and bulk depletion is studied as a function of particle fluence. Results are interpreted with the modelling provided by standalone TCAD and ATLAS Monte Carlo simulation including radiation damage effects. The dependence of the collected charge and the depletion voltage with integrated luminosity are studied through the full period of operation.
KW - Particle tracking detectors (Solid-state detectors)
KW - Si microstrip and pad detectors
KW - Solid state detectors
UR - https://www.scopus.com/pages/publications/105046004276
U2 - 10.1088/1748-0221/21/07/P07048
DO - 10.1088/1748-0221/21/07/P07048
M3 - Article
AN - SCOPUS:105046004276
SN - 1748-0221
VL - 21
JO - Journal of Instrumentation
JF - Journal of Instrumentation
IS - 7
M1 - P07048
ER -