TY - JOUR
T1 - Effect of Γ – X band crossover on resonant tunneling properties of electrons in double-barrier triangular heterostructures
AU - Chandrasekar, L. Bruno
AU - Gnanasekaran, Lalitha
AU - Santhamoorthy, Madhappan
AU - Priyadharshini, E.
AU - Karunakaran, M.
AU - Ayyar, Manikandan
AU - Sundaram, P. Shunmuga
N1 - Publisher Copyright:
© 2025 The Authors
PY - 2025/1
Y1 - 2025/1
N2 - The transfer matrix method is employed to study the electron tunneling in GaAs/GaAlAs triangular double-barrier heterostructure. The barrier width enhances the tunneling lifetime of electrons. Without Γ – X crossover in the conduction band, the resonance energy is almost constant whereas the tunneling lifetime of electrons increases as the pressure increases. Above the critical pressure, Γ – X crossover takes place. With Γ – X crossover, the energy of resonance decreases. The transparency peak becomes wider at high pressure and the electrons move with high velocity in the heterostructure at resonance when the heterostructure is subjected to high pressure.
AB - The transfer matrix method is employed to study the electron tunneling in GaAs/GaAlAs triangular double-barrier heterostructure. The barrier width enhances the tunneling lifetime of electrons. Without Γ – X crossover in the conduction band, the resonance energy is almost constant whereas the tunneling lifetime of electrons increases as the pressure increases. Above the critical pressure, Γ – X crossover takes place. With Γ – X crossover, the energy of resonance decreases. The transparency peak becomes wider at high pressure and the electrons move with high velocity in the heterostructure at resonance when the heterostructure is subjected to high pressure.
KW - Resonance
KW - Transfer matrix
KW - Tunneling
KW - Γ – X crossover
UR - https://www.scopus.com/pages/publications/85214118880
U2 - 10.1016/j.rsurfi.2024.100410
DO - 10.1016/j.rsurfi.2024.100410
M3 - Article
AN - SCOPUS:85214118880
SN - 2666-8459
VL - 18
JO - Results in Surfaces and Interfaces
JF - Results in Surfaces and Interfaces
M1 - 100410
ER -