Comparative study of methyl position effect in poly (methyl) cyclohexyl methacrylates by TSDC and TW

  • Gustave Domínguez Espinosa
  • , M. J. Sanchis
  • , R. Díaz-Calleja
  • , Claudia Pagueguy
  • , L. Gargallo
  • , D. Radiç

Producción científica: Capítulo del libro/informe/acta de congresoContribución a la conferenciarevisión exhaustiva

Resumen

A comparative study of the effect of the position of the methyl group in the cyclohexyl ring in poly (2-methy) cyclohexyl methacrylate (P2MCHM), poly (3-methyl) cyclohexyl methacrylate (P3MCHM) and poly(4-methyl) cyclohexyl methacrylate (P4MCHM) has been carried out by thermally stimulated depolarization currents (TSDC), and thermal windows (TW) measurements. In the TSDC global spectra we appreciate the evolution of the subglass and glass transition absorptions as a function of the position of the methyl group. For each sample fractional polarization is used to describe the fine structure of these complex spectra. By fitting the experimental data to standard models, the kinetic parameters of the relaxations observed have been evaluated. In the glassy state, the complex dielectric permittivity in the frequency domain was calculated at several temperatures from elementary- peaks obtained by partial TSDC curves.

Idioma originalInglés
Título de la publicación alojadaProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
EditorialInstitute of Electrical and Electronics Engineers Inc.
Páginas91-94
Número de páginas4
ISBN (versión impresa)0780383486, 9780780383487
DOI
EstadoPublicada - 2004
Publicado de forma externa
EventoProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004 - Toulouse, Francia
Duración: 5 jul. 20049 jul. 2004

Serie de la publicación

NombreProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
Volumen1

Conferencia

ConferenciaProceedings of the 2004 IEEE International Conference on Solid Dielectrics ICSD 2004
País/TerritorioFrancia
CiudadToulouse
Período5/07/049/07/04

Huella

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